The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2012
Filed:
Jan. 15, 2009
Nathan E. Yanasak, Crawfordville, GA (US);
Tom C. HU, Evans, GA (US);
Nathan E. Yanasak, Crawfordville, GA (US);
Tom C. Hu, Evans, GA (US);
Medical College of Georgia Research Institute, Inc., Augusta, GA (US);
Abstract
A system and method for minimizing, if not completely eliminating, the systematic bias present in an MR system used for DTI is disclosed. A test object or 'phantom' of the present invention is scanned with a desired DTI protocol. The eigenvalues measured with the phantom are compared to the actual values that should have been measured, and a parametric map that links measured eigenvalues to actual eigenvalues is calculated, which is applicable to the desired protocol. Future eigenvalue measurements using this protocol can be recalibrated to actual eigenvalues using this map.