The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2012

Filed:

May. 16, 2008
Applicants:

Hiroyuki Minemura, Kokubunji, JP;

Toshimichi Shintani, Kodaira, JP;

Yumiko Anzai, Ome, JP;

Soichiro Eto, Tokyo, JP;

Inventors:

Hiroyuki Minemura, Kokubunji, JP;

Toshimichi Shintani, Kodaira, JP;

Yumiko Anzai, Ome, JP;

Soichiro Eto, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical disc using super-resolution effects that achieves higher-density recording exceeding the optical resolution suffers from the signal-quality degradation caused by the normal resolution component included in the reproduction signal. To address this problem, a data reproduction method is provided. In the method, characteristic error patterns are identified and parity check codes in conformity with run-length limited coding are used to carry out efficient and reliable error correction. Error patterns caused by the normal resolution crosstalk are localized in the leading edges of a mark following a long space and in the trailing edges of a long mark. Whether an error exists in the data is determined by use of the parity check codes. When an error occurs, a pattern in which an error is most likely to occur is selected from the above-mentioned patterns by taking account of the edge shift direction, and then the error therein is corrected.


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