The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2012

Filed:

Apr. 03, 2007
Applicants:

Ira Cohen, Sunnyvale, CA (US);

Chengdu Huang, Champaign, IL (US);

Magnus Karlsson, Sollentuna, SE;

Inventors:

Ira Cohen, Sunnyvale, CA (US);

Chengdu Huang, Champaign, IL (US);

Magnus Karlsson, Sollentuna, SE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for diagnosing system health with system event logs is provided. The method includes receiving a plurality of event logs and health indicator states from a system; transducing the plurality of event logs into numeric-based metrics of the system; and deriving, based on the transduced numeric-based metrics, at least one model of the system that correlates the plurality of event logs to the corresponding health indicator states.


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