The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8095479 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 10, 2012

Filed:

Jan. 18, 2007
Applicants:

Takaaki Sekiai, Hitachi, JP;

Satoru Shimizu, Hitachi, JP;

Eiichi Kaminaga, Hitachinaka, JP;

Akihiro Yamada, Toukai-mura, JP;

Yoshiharu Hayashi, Hitachinaka, JP;

Naohiro Kusumi, Hitachinaka, JP;

Masayuki Fukai, Hitachi, JP;

Inventors:

Takaaki Sekiai, Hitachi, JP;

Satoru Shimizu, Hitachi, JP;

Eiichi Kaminaga, Hitachinaka, JP;

Akihiro Yamada, Toukai-mura, JP;

Yoshiharu Hayashi, Hitachinaka, JP;

Naohiro Kusumi, Hitachinaka, JP;

Masayuki Fukai, Hitachi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided a control apparatus including a function of generating an operation signal applied to a control subject and a model that simulates characteristics of the control subject, a function of receiving an evaluation value signal calculated based on a measurement signal obtained by applying the operation signal to the control subject and the model, and a function of learning to generate the operation signal such that an expected value of the sum of the evaluation value signals obtained from a present state to a future state is either maximum or minimum in which the evaluation value signal calculated based on the measurement signal from the model is calculated by adding a first evaluation value obtained based on a deviation between the measurement signal obtained from the model and a setpoint value, and a second evaluation value obtained based on a difference in characteristics between the model and the control subject.


Find Patent Forward Citations

Sekiai, Takaaki. (2012). Plant control apparatus and method having functions of determining appropriate learning constraint conditions (U.S. Patent No. 8095479). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8095479

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