The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2012
Filed:
Aug. 31, 2006
Joseph D. Miguel, Petaluma, CA (US);
David A. Delew, Rohnert Park, CA (US);
Joseph D. Miguel, Petaluma, CA (US);
David A. DeLew, Rohnert Park, CA (US);
Tellabs Pataluma, Inc., Naperville, IL (US);
Abstract
A method and corresponding apparatus for diagnosing problems on a time division multiple access (TDMA) optical distribution network (ODN) is provided. An example method may include: (i) measuring no-input signal power level on a communications path configured to carry upstream communications between multiple optical network terminals (ONTs) and an optical line terminal (OLT) in a passive optical network (PON) at a time no upstream communications are on the communications path from the ONTs to the OLT; (ii) comparing the measured no-input signal power level to a threshold; and (iii) generating a notification in an event the threshold is exceeded. Through the use of this method, faults in optical transmitters, such as bad solder joints, can be determined. Such faults may cause errors in parameters, such as ranging or normalization parameters, associated with communications. By determining the faults, the time required to resolve communications errors can be reduced.