The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2012
Filed:
Mar. 14, 2007
Yuan Xu, Eugene, OR (US);
Oleg Tischenko, München, DE;
Christoph Hoeschen, Hebertshausen, DE;
Abstract
A method of reconstructing an image function on the basis of a plurality of projection profiles corresponding to a plurality of projection directions through a region of investigation, each projection profile including a series of value positions, wherein measured projection values corresponding to projection lines parallel to the respective projection direction are assigned to respective value positions and a plurality of remaining value positions are empty, comprises the steps of (a) assigning first interpolation values to the empty value positions for constructing a plurality of interpolation profiles on the basis of the projection profiles, wherein the first interpolation values are obtained from a first interpolation within a group of measured projection values having the same value position in different projection profiles, and (b) determining the image function by applying a predetermined reconstruction algorithm on the interpolation profiles.