The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2012

Filed:

Feb. 23, 2009
Applicants:

Tsuyoshi Nakano, Kanagawa-ken, JP;

Susumu Kubota, Tokyo, JP;

Yasukazu Okamoto, Hyogo-ken, JP;

Inventors:

Tsuyoshi Nakano, Kanagawa-ken, JP;

Susumu Kubota, Tokyo, JP;

Yasukazu Okamoto, Hyogo-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract

A disparity profile indicating a relation between a perpendicular position on time series images and a disparity on a target monitoring area based on an arrangement of a camera is calculated. Processing areas are set, by setting a height of each of the processing areas using a length at the bottom of the image obtained by converting a reference value of a height of an object according to the profile, while setting a position of each bottom of processing areas on the image. An object having a height higher than a certain height with respect to the monitoring area, unify an object detection result in each processing area according to the disparity of the object, and detect the object of the whole monitoring area from each processing area is detected. Position and speed for the object detected by the object primary detection unit are estimated.


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