The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2012
Filed:
May. 29, 2008
Peter Dugan, Ithaca, NY (US);
Robert L. Finch, Endicott, NY (US);
Rosemary D. Paradis, Vestal, NY (US);
Peter Dugan, Ithaca, NY (US);
Robert L. Finch, Endicott, NY (US);
Rosemary D. Paradis, Vestal, NY (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
A process for contextual analysis of radiographic image data can be embodied as a method, system, and computer software program, among other things. The process can include receiving a radiographic image and performing a region analysis including identifying a region within the radiographic images having an estimated atomic number within a predetermined range and determining if the region is in an expected location. The process can also include performing a material feature analysis to identify whether a feature present in the radiographic image is associated with an obscuration characteristic. The process can include providing context information and generating, as output, a region of interest in the radiographic image, the region of interest being determined based upon a set of rules and the region analysis, the material feature analysis, and the context information.