The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2012

Filed:

Feb. 26, 2008
Applicant:

Nien L. Lee, Peoria, IL (US);

Inventor:

Nien L. Lee, Peoria, IL (US);

Assignee:

Caterpillar Inc., Peoria, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/30 (2006.01); G01B 11/24 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A multi-target photogrammetric target assembly and related method of evaluating curvilinear surface character. The target assembly includes a first photogrammetric target disposed at a first support and a second photogrammetric target disposed at a second support. The first support and the second support are operatively connected such that the first target is in predefined lateral spaced relation to the second target. The method includes providing a structure having a curvilinear surface and affixing one or more multi-target photogrammetric target assemblies to the curvilinear surface. The position of the targets is measured by one or more imaging devices to define surface contour characteristics.


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