The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2012

Filed:

Sep. 10, 2008
Applicant:

Yuuji Onimura, Hadano, JP;

Inventor:

Yuuji Onimura, Hadano, JP;

Assignee:

Terumo Kabushiki Kaisha, Shibuya-Ku, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image diagnostic apparatus includes a probe capable of light transmission and reception, wherein a reflection light is obtained from the probe by scanning the probe rotatingly, and a tomographic image is formed and outputted based on the obtained reflection light. A light-shield is provided to shield the light transmitted to the probe, a connection detector detects whether or not the probe is connected, and a controller controls the light-shield based on a detected result by the connection detector.


Find Patent Forward Citations

Onimura, Yuuji. (2012). Image diagnostic apparatus and method (U.S. Patent No. 8094319). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8094319

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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