The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2012
Filed:
Apr. 23, 2010
Makoto Ochiai, Yokohama, JP;
Takahiro Miura, Yokohama, JP;
Hidehiko Kuroda, Yokohama, JP;
Fukashi Osakata, Fujisawa, JP;
Satoshi Yamamoto, Kawaguchi, JP;
Kentaro Tsuchihashi, Yokohama, JP;
Masahiro Yoshida, Chigasaki, JP;
Akira Tsuyuki, Yokohama, JP;
Makoto Ochiai, Yokohama, JP;
Takahiro Miura, Yokohama, JP;
Hidehiko Kuroda, Yokohama, JP;
Fukashi Osakata, Fujisawa, JP;
Satoshi Yamamoto, Kawaguchi, JP;
Kentaro Tsuchihashi, Yokohama, JP;
Masahiro Yoshida, Chigasaki, JP;
Akira Tsuyuki, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
A surface inspecting method for inspecting a flaw of a test object using a surface wave and estimating a depth of the flaw of the test object from an attenuation ratio of a frequency of a generation wave, the surface inspecting method including calculating a power spectrum of generation wave generating the flaw of the test object; integrating the power spectrum of the generation wave passing the flaw of the test object and calculating an integration value thereof; converting the integration value into a flaw depth based on a calibration created beforehand and calculating the flaw depth of the test object; and displaying the calculated flaw depth of the test object.