The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2012
Filed:
Oct. 11, 2004
Mark Bradley, Highfield, GB;
Jean-francois Thaburet, Yerville, FR;
Mark Bradley, Highfield, GB;
Jean-Francois Thaburet, Yerville, FR;
University of Southampton, Southampton, GB;
Abstract
In a method of measuring a temperature value associated with melting, softening or decomposition of sample substances, an array of samples is deposited onto a support tray. The support tray is placed onto a heating device provided with temperature sensing means, the support tray is illuminated, and the array of samples is observed by a imaging device. WNle varying the temperature of the heating device, the image data from the imaging device is fed to an image recording device and temperature values associated with each feed of image data are also recorded. The image data is reviewed to detect changes in the image, such as image intensity, at each or selected sample locations, and the temperature of the heating device at an image change associated with a change in state of a sample is logged. Image processing software may be used to detect changes in the image, for example in the intensity of the image, at each sample location. The method may be used as a means for rapidly obtaining a melting point value for comparison of the physical characteristics of the members of a library of samples, especially polymer samples.