The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2012

Filed:

Feb. 01, 2008
Applicants:

Hideharu Takezawa, Osaka, JP;

Shinya Fujimura, Osaka, JP;

Sadayuki Okazaki, Osaka, JP;

Kazuyoshi Honda, Osaka, JP;

Inventors:

Hideharu Takezawa, Osaka, JP;

Shinya Fujimura, Osaka, JP;

Sadayuki Okazaki, Osaka, JP;

Kazuyoshi Honda, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B05C 11/00 (2006.01); H01M 4/02 (2006.01); H01M 4/13 (2006.01); C23C 16/00 (2006.01); C23C 16/52 (2006.01); C23C 14/54 (2006.01); G01B 11/26 (2006.01); G01C 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for testing a negative electrode of a secondary battery, light is irradiate to an active material layer formed on a current collector having a plurality of projections at least on one side thereof, the active material layer including first columnar bodies of active material grown obliquely from the projections. The angle is measured between the reflected light from the active material layer and a normal line parallel to the thickness direction of the current collector.


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