The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2012

Filed:

May. 08, 2009
Applicant:

Young-kuk Kim, Busan, KR;

Inventor:

Young-Kuk Kim, Busan, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a non-destructive test apparatus which can be applied not only to a structure in dry conditions but also to a structure constructed under water or in a location to which it is difficult for a worker to gain access. The non-destructive test apparatus includes a support frame which is disposed adjacent to the target structure and has a vertical guide rail, and a vacuum box which moves upwards or downwards along the guide rail of the support frame. The vacuum box is attached to the target structure and creates a vacuum therein. The non-destructive test apparatus further includes a hoist which is provided on the upper end of the support frame to move the vacuum box upwards or downwards, a fastening unit which fastens the support frame and the vacuum box to the target structure, and a vacuum pump which creates a vacuum in the vacuum box. The non-destructive test apparatus further includes a defect detecting unit which measures a strength of vacuum in the vacuum box to determine whether the target structure is defective, and a control unit which controls the elements.


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