The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2012
Filed:
Jul. 21, 2008
Masahiro Miki, Tokai, JP;
Yoshiaki Nagashima, Hitachi, JP;
Masao Endou, Kitaibaraki, JP;
Kojiro Kodaira, Hitachinaka, JP;
Mitsuru Odakura, Hitachi, JP;
Masahiro Miki, Tokai, JP;
Yoshiaki Nagashima, Hitachi, JP;
Masao Endou, Kitaibaraki, JP;
Kojiro Kodaira, Hitachinaka, JP;
Mitsuru Odakura, Hitachi, JP;
Hitachi-GE Nuclear Energy, Ltd., Ibaraki, JP;
Abstract
Disclosed herein are an apparatus and a technique for quickly detecting a defective portion including wastage, which has occurred in piping having a straight piping portion or a bending zone, in the nondestructive inspection using a guided wave. A guided wave sensorincluded in a guided wave inspection deviceis mounted to the outer surface of piping. A guided wave is propagated to an inspection area of the piping. If a defective portion exists, the guided wave sensorreceives the guided wave that has been reflected from the defective portion. As a result, the guided wave inspection devicecan acquire receive information including receive information derived from the defect.