The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2012
Filed:
Nov. 14, 2010
Yanchen Zhang, San Clemente, CA (US);
Rene Roland Laferriere, Marlborough, MA (US);
Yanchen Zhang, San Clemente, CA (US);
Rene Roland Laferriere, Marlborough, MA (US);
Other;
Abstract
A high-speed measuring electronic digital outside micrometer allowing a user to make measurements quickly and effectively compared to conventional electronic outside micrometers with rotary thread spindles, which have limited measuring speed. This high-speed measuring electronic digital outside micrometer features: a linear motion digital sensor, a linear scale digital sensor, a linear motion digital sensor base, a digital display unit, an electronic processing unit, a micrometer body, a linear spindle, a linear spindle movement unit, a spindle control unit, a micrometer anvil, and retractable springs. In a stationary position, the measuring surface of the micrometer anvil and the linear spindle are in contact to the other. By operating the spindle control unit, it will create distance between the micrometer anvil and the linear spindle measuring surface. This distance is a measurable distance of the micrometer. By set free of the spindle control unit, the retractable springs will re-set the micrometer to its stationary position.