The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2012
Filed:
Apr. 23, 2008
Marc Faucher, Lille, FR;
Lionel Buchaillot, Marcq en Baroeul, FR;
Jean-pierre Aime, Bordeaux, FR;
Bernard Louis Amand Legrand, Lille, FR;
Gerard Couturier, Gradignan, FR;
Marc Faucher, Lille, FR;
Lionel Buchaillot, Marcq en Baroeul, FR;
Jean-Pierre Aime, Bordeaux, FR;
Bernard Louis Amand Legrand, Lille, FR;
Gerard Couturier, Gradignan, FR;
Centre National de la Recherche Scientifique, Paris, FR;
Universite de Bordeaux 1, Talence, FR;
Abstract
A probe for atomic force microscopy (SM) comprising a micromechanical resonator (RMM) and a tip for atomic force microscopy (P) projecting from said resonator, the probe being characterized in that: it also includes means (EL) for selectively exciting a volume mode of oscillation of said resonator (RMM); and in that said tip for atomic force microscopy (P, P') projects from said resonator substantially in correspondence with an antinode point (PV) of said volume mode of oscillation. An atomic force microscope including such a probe (SM′). A method of atomic force microscopy including the use of such a probe.