The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2012
Filed:
Feb. 27, 2010
Method and device for clustering categorical data and identifying anomalies, outliers, and exemplars
David B. Fogel, San Diego, CA (US);
David B. Fogel, San Diego, CA (US);
Natural Selection, Inc., San Diego, CA (US);
Abstract
One aspect of the invention is a method for assigning categorical data to a plurality of clusters. The method may include identifying a plurality of categories associated with the data. The method also may include, for each category in the plurality of categories, identifying at least one element associated with the category. The method also may include specifying a number of clusters to which the data may be assigned. The method additionally may include assigning at least some of the data, wherein each assigned datum is assigned to a respective one of the clusters. The method further may include, for at least one of the clusters, determining, for at least one category, the frequency in data assigned to the cluster of at least one element associated with the category. Further, the invention may provide for detecting outliers, anomalies, and exemplars in the categorical data.