The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2012
Filed:
Feb. 06, 2009
Ashish Agarwal, Sunnyvale, CA (US);
Eric Bauer Arbanovella, Boonville, CA (US);
Diane Lambert, Berkeley Heights, NJ (US);
Ilia Mirkin, New York, NY (US);
Michael M. Meyer, Seattle, WA (US);
James A. Morrison, San Francisco, CA (US);
Daryl Pregibon, Hoboken, NJ (US);
Susan Shannon, San Mateo, CA (US);
Diane L. Tang, Palo Alto, CA (US);
Ashish Agarwal, Sunnyvale, CA (US);
Eric Bauer Arbanovella, Boonville, CA (US);
Diane Lambert, Berkeley Heights, NJ (US);
Ilia Mirkin, New York, NY (US);
Michael M. Meyer, Seattle, WA (US);
James A. Morrison, San Francisco, CA (US);
Daryl Pregibon, Hoboken, NJ (US);
Susan Shannon, San Mateo, CA (US);
Diane L. Tang, Palo Alto, CA (US);
Google Inc., Mountain View, CA (US);
Abstract
User queries are received, with each query requesting a service from a server. Overlapping experiments are performed on at least a portion of the queries, with each experiment modifying one or more parameters associated with the queries or parameters associated with processing of the queries, and with the experiments organized into layers. Two or more experiments in different layers are allowed to be performed on the same query, and for any given layer, at most one experiment is allowed to be performed on the same query.