The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2012
Filed:
Sep. 11, 2008
Shailesh Rajnikant Patel, Gujarat, IN;
Ramprasad Yelchuru, Bangalore, IN;
Srikanth Ryali, Bangalore, IN;
Pradeep K. Shetty, Bangalore, IN;
Gudi Ravindra, Bangalore, IN;
Shailesh Rajnikant Patel, Gujarat, IN;
Ramprasad Yelchuru, Bangalore, IN;
Srikanth Ryali, Bangalore, IN;
Pradeep K. Shetty, Bangalore, IN;
Gudi Ravindra, Bangalore, IN;
Honeywell International Inc., Morristown, NJ (US);
Abstract
Systems and methods () for offline/online performance monitoring of batch processes (BPs) involving obtaining archived data (AD) obtained during runs of BP and including information defining a batch quality attribute for each run. The method also involves forming clusters by classifying AD for the runs into classes based on the batch quality attribute(s) and building a first multivariate statistical model (MSM) using AD. The method can further involve building a wavelet analysis based feature matrix (FM) using AD, forming a first projection () by projecting FM onto a first MSM, building a second MSM () using information obtained from the first projection, and computing centroids (C, . . . , C) and boundary profiles for the clusters (). The method can involve performing an online/offline performance monitoring () using an integrated version of the first and second MSM, a classification algorithm, centroids, and boundary profiles.