The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2012
Filed:
Jan. 08, 2009
Hua-dong Cheng, Shenzhen, CN;
Feng Zhou, Shenzhen, CN;
Bin-gang Duan, Shenzhen, CN;
Zhi-xin Xu, Shenzhen, CN;
Ruey-shyang You, Taipei Hsien, TW;
Han-che Wang, Taipei Hsien, TW;
Hua-Dong Cheng, Shenzhen, CN;
Feng Zhou, Shenzhen, CN;
Bin-Gang Duan, Shenzhen, CN;
Zhi-Xin Xu, Shenzhen, CN;
Ruey-Shyang You, Taipei Hsien, TW;
Han-Che Wang, Taipei Hsien, TW;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
A method for testing electronic apparatuses is provided. The method includes: reading an identification (ID) of an emulator adapter; searching for the script name in a test table according to the ID; fetching the script from a storage according to the determined script name and running the fetched script to pass each of input commands; and receiving and identifying each of the input commands to simulate a key input via an electrical conductive path, correspondingly to the input command, of the emulator adapter, such that an input key corresponding to the key input of the to-be-tested electronic apparatus is activated and the to-be-tested electronic apparatus performs a function associated with the input key correspondingly. A related test apparatus is also provided.