The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2012
Filed:
Mar. 30, 2005
Kieran Gerard Larkin, Putney, AU;
Peter Alleine Fletcher, Rozelle, AU;
Stephen James Hardy, West Pymble, AU;
Kieran Gerard Larkin, Putney, AU;
Peter Alleine Fletcher, Rozelle, AU;
Stephen James Hardy, West Pymble, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A method () of measuring performance parameters of an imaging device () is disclosed. The method () maintains a test pattern image (), the test pattern image () comprising alignment features and image analysis features. A test chart () containing a representation of the test pattern image is next imaged using the imaging device () to form a second image (). The test pattern image () and the second image () are then registered using region based matching () operating on the alignment features. Finally, the performance parameters are measured by analysing () the image analysis features.