The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2012
Filed:
Mar. 12, 2009
Michael G. Meyer, Seattle, WA (US);
Jon W. Hayenga, Redmond, WA (US);
Thomas M. Abbott, Issaquah, WA (US);
David E. Steinhauer, Lynnwood, WA (US);
Michael G. Meyer, Seattle, WA (US);
Jon W. Hayenga, Redmond, WA (US);
Thomas M. Abbott, Issaquah, WA (US);
David E. Steinhauer, Lynnwood, WA (US);
Visiongate, Inc., Phoenix, AZ (US);
Abstract
Correcting pattern noise projection images includes acquiring a set of projection images with an optical tomography system including a processor, where each of the set of projection images is acquired at a different angle of view. A threshold is applied to each projection image produce a set of threshold images. Each threshold image may optionally be dilated to produce a set of dilated images that are summed to form an ensemble image. Each of the dilated images is processed to produce a set of binary images. The set of binary images are summed to form an ensemble mask. The ensemble image is divided by the ensemble mask to yield a background pattern noise image. Each projection image is multiplied by a scaling factor and divided by the background pattern noise to produce a quotient image that is filtered to produce a noise corrected projection image.