The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2012
Filed:
Oct. 25, 2006
Oleg Tischenko, München, DE;
Christoph Hoeschen, Hebertshausen, DE;
Yuan Xu, Eugene, OR (US);
Abstract
An imaging method for imaging a region of investigation of an object comprises the steps of generating an energy input beam with an energy beam source, irradiating the region of investigation with energy input beam components of the energy input beam along a plurality of projection directions, the energy input beam components being formed with a frame mask being arranged between the energy input beam and the object and including frame mask windows, measuring first integrated attenuation values of the energy input beam components with an outer detector device arranged outside the frame mask, measuring second integrated attenuation values of the energy input beam components with a frame mask detector device being arranged on an inner surface of the frame mask, and reconstructing an image of the region of investigation based on the first and second integrated attenuation values. Furthermore, an imaging device for imaging a region of investigation of an object is described.