The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2012
Filed:
Dec. 16, 2008
John Erik Hershey, Ballston Lake, NY (US);
Nick Andrew Van Stralen, Bloomfield, NY (US);
Harold Woodruff Tomlinson, Jr., Ballston Spa, NY (US);
John Anderson Fergus Ross, Niskayuna, NY (US);
Zhiyuan Ren, Malta, NY (US);
Zexin Pan, Madison, AL (US);
Victor Petrovich Ostroverkhov, Ballston Lake, NY (US);
Xiaolei Shi, Niskayuna, NY (US);
John Erik Hershey, Ballston Lake, NY (US);
Nick Andrew Van Stralen, Bloomfield, NY (US);
Harold Woodruff Tomlinson, Jr., Ballston Spa, NY (US);
John Anderson Fergus Ross, Niskayuna, NY (US);
Zhiyuan Ren, Malta, NY (US);
Zexin Pan, Madison, AL (US);
Victor Petrovich Ostroverkhov, Ballston Lake, NY (US);
Xiaolei Shi, Niskayuna, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
The present techniques provide systems and methods for modulation coding of data on optical disks, such as holographic data disks, and techniques for reading that data back from the disks. The techniques involve parsing a bit stream into a sequence of individual bit-patterns, and then using the individual bit patterns to select a symbol, or matrix, from a lookup table of previously selected matrices. The symbols are selected according to predetermined criteria that may help make the disk more resistant to interferences and errors, such as surface scratches, and the like. For example, criteria that may be used to select the symbols are the number of reflective and non-reflective regions within each matrix, and the number of sequential reflective regions, among others. The symbols may be written to the disk in a two-dimensional fashion, e.g., across adjacent tracks, or in a three-dimensional fashion, e.g., across adjacent data layers.