The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2012

Filed:

Apr. 04, 2007
Applicants:

Christian Gugler, Ramstadt, DE;

Shahram Hauck, Hanau, DE;

Inventors:

Christian Gugler, Ramstadt, DE;

Shahram Hauck, Hanau, DE;

Assignee:

manroland AG, Offenbach, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method for determining parameters relevant to the print quality of a printed product. A macroscopic photogram of a measuring field of the printed product is recorded using a camera having a macro lens. An actual value of a parameter relevant to the print quality is determined from the macroscopic photogram. The actual value is compared to a nominal value of the parameter relevant to the print quality. Whether the measuring field is printed with adequate quality is determined based on the comparison of the actual valve with the nominal value of the parameter relevant to the print quality.


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