The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2012
Filed:
Mar. 11, 2009
Brynmor J. Davis, Champaign, IL (US);
Jin Sun, Mountain View, CA (US);
John C. Schotland, Merion, PA (US);
Paul S. Carney, Champaign, IL (US);
Brynmor J. Davis, Champaign, IL (US);
Jin Sun, Mountain View, CA (US);
John C. Schotland, Merion, PA (US);
Paul S. Carney, Champaign, IL (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
A method and computer program product for imaging an object are disclosed. The object is illuminated with an electromagnetic wave, characterized by a spectrum of illuminating wavevectors. Electromagnetic waves scattered by the object are detected, and are characterized by a spectrum of detected wavevectors. An aperture equal to or smaller than an instantaneous characterizing wavelength of the illuminating electromagnetic wave is disposed between the source and the detector. At least one of the illuminating and detected wavevectors is varied in magnitude to provide information regarding a scattering characteristic of the object. By applying a forward model of the aperture to derive a three-dimensional scattering model, a three-dimensional reconstruction of the object may be obtained by inverting a detected data function in terms of the forward model.