The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2012

Filed:

Nov. 26, 2008
Applicants:

Takahiro Yano, Akishima, JP;

Masatoshi Okutomi, Tokyo, JP;

Masao Shimizu, Tokyo, JP;

Inventors:

Takahiro Yano, Akishima, JP;

Masatoshi Okutomi, Tokyo, JP;

Masao Shimizu, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/262 (2006.01); H04N 5/228 (2006.01); G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processor includes an inter-superimposed-image deformation acquisition unit configured to acquire deformation information between superimposed images included in a multiple image in which images of a subject are superimposed, an image deformation unit configured to generate at least two deformed images by performing deformation processing with respect to the multiple image at least twice to be geometrically deformed based on the acquired deformation information between superimposed images, and a signal intensity relationship acquisition unit configured to acquire signal intensity relationship information indicative of a relationship between signal intensities of the superimposed images included in the multiple image. The image processor further includes a signal processing unit configured to perform addition processing of the at least two deformed images generated from the deformation processing by using the acquired signal intensity relationship information.


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