The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8089295 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 03, 2012

Filed:

Dec. 31, 2007
Applicants:

Arley Cleveland Marley, San Jose, CA (US);

David John Seagle, Morgan Hill, CA (US);

Inventors:

Arley Cleveland Marley, San Jose, CA (US);

David John Seagle, Morgan Hill, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G11B 5/127 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the invention provide methods, systems and apparatus for testing electronic components, and more specifically for testing magnetoresistive heads. A pair of top shield pads and a pair of bottom shield pads may be formed in a kerf region of a wafer on which magnetoresistive heads are formed. The top shield pads, bottom shield pads, and a magnetoresistive head may form a circuit that may be coupled with a testing circuit to exchange test signals configured to test the magnetic head. The pair of bottom shield pads may provide balanced impedance to substrate that nullifies the effects of broadband noise.


Find Patent Forward Citations

Marley, Arley. (2012). Wafer level balanced capacitance design for magnetic heads (U.S. Patent No. 8089295). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8089295

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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