The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2012

Filed:

Sep. 02, 2008
Applicants:

Kosei Ueno, Hokkaido, JP;

Hiroaki Misawa, Hokkaido, JP;

Dai Ohnishi, Kyoto, JP;

Takui Sakaguchi, Kyoto, JP;

Yoichi Mugino, Kyoto, JP;

Inventors:

Kosei Ueno, Hokkaido, JP;

Hiroaki Misawa, Hokkaido, JP;

Dai Ohnishi, Kyoto, JP;

Takui Sakaguchi, Kyoto, JP;

Yoichi Mugino, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 5/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a metallic structure including a metallic nano-chain with plasmon resonance absorption, a metallic nanoparticle forming the metallic nano-chain is formed in a circular, triangle, or rhomboid shape. The wavelength selectivity can be increased also by forming a closed region by mutually linking all of metallic nanoparticles that are mutually linked with bottlenecks. In a photodetector, a photodetection unit including a current detection probe, a nano-chain unit, and a current detection probe is arranged on a substrate. The nano-chain unit is a metallic structure with plasmon resonance absorption, where metallic nanoparticles are mutually linked with bottlenecks. Each current detection probe has a corner whose tip is formed with a predetermined angle, and this corner is arranged to face the tip of the nano-chain unit, i.e., a corner of the metallic nanoparticle. Photodetection with high wavelength selectivity is performed based on a change in the initial voltage of the current-voltage characteristic.


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