The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8087823 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 03, 2012

Filed:

Aug. 18, 2008
Applicants:

Francois Aube, PQ, CA;

Timothy M. Curtin, Burlington, VT (US);

Matthew S. Grady, Burlington, VT (US);

Thomas P. Scanlon, Jericho, VT (US);

Eric N. Smith, Milton, VT (US);

Inventors:

Francois Aube, PQ, CA;

Timothy M. Curtin, Burlington, VT (US);

Matthew S. Grady, Burlington, VT (US);

Thomas P. Scanlon, Jericho, VT (US);

Eric N. Smith, Milton, VT (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01K 1/00 (2006.01); G01K 7/00 (2006.01); G01K 3/00 (2006.01); H01L 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A structure has a heat dissipating feature, an internal temperature measurement device, and a memory. The structure generates heat as power is supplied to the structure, and a threshold voltage of the internal temperature measurement device changes as the temperature of the temperature measurement device changes. The embodiments herein establish a linear relationship between temperature and threshold voltage by heating the structure to a first temperature and recording a first threshold voltage, and then heating the structure to a second temperature and recording a second threshold voltage. From this, the embodiments herein calculate a linear relationship between temperature and threshold voltage. Further, the embodiments herein can calculate the temperatures of the structure based only upon the linear relationship and threshold voltages measured from internal temperature measurement device.


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