The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2011

Filed:

Nov. 03, 2006
Applicants:

Ling Zhou, Cedar Park, TX (US);

Stephen G. Hammack, Austin, TX (US);

Bruce Campney, Manor, TX (US);

Larry O. Jundt, Round Rock, TX (US);

Mark J. Nixon, Round Rock, TX (US);

Stephen Gilbert, Austin, TX (US);

Inventors:

Ling Zhou, Cedar Park, TX (US);

Stephen G. Hammack, Austin, TX (US);

Bruce Campney, Manor, TX (US);

Larry O. Jundt, Round Rock, TX (US);

Mark J. Nixon, Round Rock, TX (US);

Stephen Gilbert, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, apparatus, and articles of manufacture for modifying process control data involve obtaining the process control data in an extensible markup language format, converting the process control data in the extensible markup language format to a second data format, and storing the process control data in a database. The process control data is subsequently edited by retrieving the process control data from the database, modifying the process control data, storing the modified process control data in the second data format in the database, converting the modified process control data from the second data format to the extensible markup language format, and storing the modified process control data in the extensible markup language format.


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