The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
Mar. 25, 2010
Sumit Basu, Seattle, WA (US);
John Dunagan, Bellevue, WA (US);
Sumit Basu, Seattle, WA (US);
John Dunagan, Bellevue, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Technology is described for diagnosing problem causes in complex environments by using factorization of a plurality of features. An embodiment can include the operation of identifying a plurality of entities having entity weighting parameters. The entities may be computing devices. The plurality of features can be associated with a respective entity having feature weighting parameters, and an instance of the plurality of features can be associated with individual entity instances. A fault label can be applied for an ensemble entity. The plurality of features can be linked using the feature weighting parameter and the entity weighting parameter with a bilinear model. A further operation is estimating weighting values for the entity weighting parameters and the feature weighting parameters for use in a statistical model. The meaningful feature parameters can be found for the statistical model that are likely to be responsible for entity faults.