The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2011

Filed:

Aug. 31, 2009
Applicants:

Vitaliy Bondar, San Jose, CA (US);

Ching-hua Chen-ritzo, Mahopac, NY (US);

Rick Allen Hamilton, Ii, Charlottesville, VA (US);

Clifford Alan Pickover, Yorktown Heights, NY (US);

Ralph Peter Williams, Danville, CA (US);

Inventors:

Vitaliy Bondar, San Jose, CA (US);

Ching-Hua Chen-Ritzo, Mahopac, NY (US);

Rick Allen Hamilton, II, Charlottesville, VA (US);

Clifford Alan Pickover, Yorktown Heights, NY (US);

Ralph Peter Williams, Danville, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

Methods, systems and apparatus for optimizing consumption of one or more resources are presented. For example, a method may be implemented on a processor device and includes obtaining user preferences for the consumption of resources that include water and electricity, predicting the consumption of, and a first metric for the consumption of, the resources for each of a plurality of first time periods, determining a projected second metric for the consumption of the resources during a second time period according to the predicted consumption and the predicted first metric, and optimizing the consumption of the resources according to the projected second metric and the user preferences. The second time period includes the plurality of first time periods. The first metric is associated with the user preferences and at least one of the plurality of first time periods. The second metric indicates full or partial projected attainment of the preferences during the second time period.


Find Patent Forward Citations

Loading…