The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
Mar. 14, 2007
Mark S. Penke, West Henrietta, NY (US);
Donald A. Brown, Honeoye Falls, NY (US);
Sarah E. Campbell, Rochester, NY (US);
Keith S. Karn, Avon, NY (US);
Cornell Juliano, Churchville, NY (US);
David M. Parsons, Victor, NY (US);
Mark S. Penke, West Henrietta, NY (US);
Donald A. Brown, Honeoye Falls, NY (US);
Sarah E. Campbell, Rochester, NY (US);
Keith S. Karn, Avon, NY (US);
Cornell Juliano, Churchville, NY (US);
David M. Parsons, Victor, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A method is provided for operating a computer to analyze image evaluation data from electronic survey respondents to evaluate preferences related to two dimensional and three dimensional images. Data files, which include designated area data, image attributes, and survey respondent opinions for one or more images in an electronic survey, are received. A graphical user interface permits an operator to reformat the designated area data and set analysis parameters. Cluster analysis is performed on the data files to reduce the dimensionality of the designated area data and to classify areas of the survey images that generate positive and negative responses. The analysis produces coordinate data to map cluster classifications and for construction of a heat map. In association with descriptive statistical analysis, cluster score evaluation is performed to identify the clusters of interest. Respondent comments and results from the statistical analysis are linked to clusters of interest.