The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
Jan. 13, 2009
Masato Shimodaira, Osaka, JP;
Masato Shimodaira, Osaka, JP;
Keyence Corporation, Osaka, JP;
Abstract
There is provided a defect detection apparatus capable of highly accurately detecting a defect of a size not larger than a size desired by the user, in which the size setting device sets the defect size, the reduction ratio setting device sets an image reduction ratio based on the set defect size, the image reduction device generates a reduced image obtained by reducing the original multi-valued image, the filter processing device performs filter processing on the reduced image for removing a defect in the reduced image, the image enlarging device generates an enlarged image obtained by enlarging the reduced image, subjected to the filter processing, at an image enlargement ratio corresponding to the reciprocal of the image reduction ratio, and the difference calculating device generates a difference image obtained by performing a calculation of a difference between the original multi-valued image and the enlarged image.