The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
Oct. 17, 2008
Chih-kuang Chang, Taipei Hsien, TW;
Xian-yi Chen, Shenzhen, CN;
Yi-rong Hong, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
A computer-implemented method for analyzing impurities of an object is provided. The method includes selecting a region from an image of the object, pre-treating the region to calculate a threshold, processing the region and deleting the points from an outer layer of the region. The method further includes setting a starting point and search directions, determining a point before a first boundary point as an origin of the region and searching the next boundary points if the first boundary point has been searched. The method also includes searching all the boundary points in the region, forming an impurity if the last boundary point coincides with the first boundary point, seed filling the impurity and calculating an area value, and comparing the area value with an allowable area value to determine whether the impurity satisfies impurity specifications.