The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
Oct. 06, 2006
Joerg Bredno, Aachen, DE;
Georg Rose, Duesseldorf, DE;
Juergen Weese, Aachen, DE;
Alexandra Groth, Aachen, DE;
Sabine Mollus, Aachen, DE;
Matthias Bertram, Cologne, DE;
Jens Wiegert, Aachen, DE;
Christoph Neukirchen, Aachen, DE;
Joerg Bredno, Aachen, DE;
Georg Rose, Duesseldorf, DE;
Juergen Weese, Aachen, DE;
Alexandra Groth, Aachen, DE;
Sabine Mollus, Aachen, DE;
Matthias Bertram, Cologne, DE;
Jens Wiegert, Aachen, DE;
Christoph Neukirchen, Aachen, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
Adaptively controlling an imaging system () includes constructing model feature characteristics () of a process over time, determining parameters and commands () for controlling the imaging system for each state of the process, performing data acquisition () for the process, extracting current features () of the process from the acquired data, matching () the current features () with the model feature characteristics () to determine a state of the process (), and controlling the data acquisition based on the state of the process to produce optimized data.