The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
Sep. 12, 2008
Ha-young Yang, Yongin-si, KR;
Jeong-tae OH, Yongin-si, KR;
Hwa-sun You, Suwon-si, KR;
Jae-ho Jeon, Seongnam-si, KR;
Ha-Young Yang, Yongin-si, KR;
Jeong-Tae Oh, Yongin-si, KR;
Hwa-Sun You, Suwon-si, KR;
Jae-Ho Jeon, Seongnam-si, KR;
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Abstract
An apparatus and method for estimating a Signal to Interference plus Noise Ratio (SINR) in a wireless communication system are provided. The method includes processing a received signal by Orthogonal Frequency Division Multiplexing (OFDM) demodulation to convert the received signal into frequency-domain data, selecting ranging data from the frequency-domain data, multiplying the selected ranging data by a ranging code to perform code demodulation, calculating at least one norm value and at least one coherent norm value by bundle for the code-demodulated data and estimating an SINR using the calculated at least one norm value and at least one coherent norm value.