The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
Jun. 18, 2008
Adam B. Healey, Newburyport, MA (US);
Mark J. Marlett, Livermore, CA (US);
Adam B. Healey, Newburyport, MA (US);
Mark J. Marlett, Livermore, CA (US);
Agere Systems Inc., Allentown, PA (US);
Abstract
One embodiment of the present invention processes a signal of interest through an optional reference channel, combines the resulting signal with white noise, and then processes the noisy signal through a reference receiver. Two metrics are calculated from the results of that processing: Non-Compensable Data-Dependent Jitter (NC-DDJ) and Enhanced Transmitter and Waveform Dispersion Penalty (Enhanced TWDP). Within the reference receiver, a variable delay module sweeps the eye opening defined by the noise-free samples of the signal of interest and determines the transition points (i.e., edges) of the eye opening. Those transition points are compared to the Unit Interval to yield NC-DDJ. Further, the signal-to-noise ratio (SNR) of the noisy samples of the signal of interest is compared to the SNR of an ideal receiver (i.e., matched filter) driven by an ideal transmitter via an ideal channel with additive white Gaussian noise n(t) to yield Enhanced TWDP.