The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
Aug. 27, 2008
Hrvoje Petek, Pittsburg, PA (US);
Atsushi Kubo, Ibaraki, JP;
Nikolaus Johannes Pontius, Berlin, DE;
University of Pittsburgh of the Commonwealth System of Higher Education, Pittsburgh, PA (US);
Abstract
System(s) and method(s) to probe electromagnetic fields at the surface of a solid-state material are provided. The technique combines ultrafast (e.g., less than 10 fs) optical excitation and electron microscopy to generate electronic excitations and image the ensuing electromagnetic fields with nanometer-scale spatial resolution and femtosecond time-scale resolution. In addition, time-of-flight energy analysis facilitates imaging of relaxation a generated electronic excitation. The dynamics of the electromagnetic fields can be probed interferometrically through generation of multi-frame imaging, with inter-frame frequency of the order of a few hundreds of attoseconds, of interference patterns among an electric field associated with an excitation in a sample or device and the electromagnetic field of a probe pulse coherent with an excitation pulse. Quality assurance of nanoscopic devices based on plasmonic, photonic, electronic, spintronic operation can be analyzed with spectroscopy provided in the subject innovation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile