The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
Mar. 13, 2007
Applicant:
Miki Ogawa, Machida, JP;
Inventor:
Miki Ogawa, Machida, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/55 (2006.01);
U.S. Cl.
CPC ...
Abstract
A detecting element used for a detecting device for detecting a target substance in a sample by utilizing plasmon resonance. The detecting element includes a substrate and a plurality of metal members provided on the substrate, the metal member constituting a columnar structure and being oriented in a long axis direction thereof. The detecting element can improve sensitivity of the detecting device for detecting a target substance utilizing plasmon resonance.
Ogawa, Miki. (2011). Detecting element, and target substance detecting device and method of detecting target substance using the same (U.S. Patent No. 8085405). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8085405
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile