The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2011
Filed:
May. 25, 2007
Takumi Uesugi, Chuo-ku, JP;
Takeo Kagami, Chuo-ku, JP;
Tetsuro Sasaki, Chuo-ku, JP;
Kei Hirata, Chuo-ku, JP;
Masaru Hirose, Chuo-ku, JP;
Chi Man Lee, Shatin, HK;
Kwok Piu Tso, Shatin, HK;
Takumi Uesugi, Chuo-ku, JP;
Takeo Kagami, Chuo-ku, JP;
Tetsuro Sasaki, Chuo-ku, JP;
Kei Hirata, Chuo-ku, JP;
Masaru Hirose, Chuo-ku, JP;
Chi Man Lee, Shatin, HK;
Kwok Piu Tso, Shatin, HK;
TDK Corporation, Tokyo, JP;
SAE Magnectics (H.K.) Ltd., Hong Kong, CN;
Abstract
A noise-testing method for a thin-film magnetic head with an MR read head element and a heating unit capable of applying a heat and a stress to the MR read head element, includes a step of applying alternately and discontinuously with each other an electrical power having a first level and an electrical power having a second level higher than the first level to the heating unit, and a step of evaluating the thin-film magnetic head by measuring a noise output or noise outputs obtained from the MR read head element when the electrical power or the electrical powers are applied to the heating unit.