The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2011

Filed:

Feb. 09, 2011
Applicants:

David Jonathan Hall, San Diego, CA (US);

Guobin MA, Dorval, CA;

Frederic Lesage, Montreal, CA;

Pascal Gallant, Laval, CA;

Inventors:

David Jonathan Hall, San Diego, CA (US);

Guobin Ma, Dorval, CA;

Frederic Lesage, Montreal, CA;

Pascal Gallant, Laval, CA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/58 (2006.01); G21H 3/02 (2006.01); G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatuses for determining the depth and concentration of fluorophores in a turbid medium are disclosed. The method advantageously provides for a rapid estimation of the depth of the flurophore using characteristics of a temporal point spread function. The concentration of the flurophore can be determined using the method of the present invention by combining a calculated depth of the flurophore with a measurement of the intensity of the emitted fluorescence. The intensity can be accurately measured by the apparatus disclosed herein which combine back-reflection and trans-illumination geometries for the source of light injecting and detection.


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