The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2011

Filed:

Mar. 26, 2008
Applicants:

Su Yong Kim, Daejeon, KR;

Dae Sik Choi, Daejeon, KR;

Dong Hyun Lee, Daejeon, KR;

DO Hoon Lee, Daejeon, KR;

Inventors:

Su Yong Kim, Daejeon, KR;

Dae Sik Choi, Daejeon, KR;

Dong Hyun Lee, Daejeon, KR;

Do Hoon Lee, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are an apparatus and method of detecting and controlling a privilege level violation process. The apparatus monitors whether higher-privileged processes depend on information provided from lower-privileged objects or denies the higher-privileged processes to access the lower-privileged objects. The apparatus is provided in a process, and monitors whether a process accesses to a lower-privileged object. The apparatus gives a warning message or denies an access of the process to the lower-privileged object when it detects that the higher-privileged process access to the lower-privileged object. Therefore, the apparatus of detecting and controlling a privilege level violation process detects weaknesses that may be caused by privilege level violation, thus allowing a system to be safely operated.


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