The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2011
Filed:
May. 31, 2009
Xiu Yang, Chengdu, CN;
Dujuan Tang, Chengdu, CN;
Xiu Yang, Chengdu, CN;
Dujuan Tang, Chengdu, CN;
IPGoal Microelectronics (SiChuan) Co., Ltd., High-Tech Incubation Park, Chengdu Sichuan Province, CN;
Abstract
The present invention discloses a memory build-in self-test comprising steps of: (a) determining whether there is redundant address in the ROM; (b) when there is redundant address for storing standard check code, transferring the coefficient file in the ROM to a predetermined format; (c) producing a self-test logic and a standard check code corresponding to the ROM via design tool; (d) writing the standard check code into the redundant address and generating a new ROM. The present invention can assure that the standard check code and coefficient can be simply revised via corresponding way of Mask Change, so as to detect the damages of ROM by using memory build-in self-test (MBIST) which does not need to remake a whole set of Mask to revise the standard check code outside the ROM, so as to save cost and time, and lower the difficulty to update the product.