The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2011
Filed:
Mar. 02, 2010
Applicants:
Takaaki Nagai, Kobe, JP;
Masaharu Shibata, Kobe, JP;
Kunio Ueno, Kakogawa, JP;
Noriyuki Nakanishi, Kakogawa, JP;
Inventors:
Takaaki Nagai, Kobe, JP;
Masaharu Shibata, Kobe, JP;
Kunio Ueno, Kakogawa, JP;
Noriyuki Nakanishi, Kakogawa, JP;
Assignee:
Sysmex Corporation, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); C12M 1/36 (2006.01); G01N 27/417 (2006.01); G01N 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A sample analysis system includes a reagent preparation unit and a measurement unit. The reagent preparation unit has: a state detector which detects at least one of a state of the reagent preparation unit and a state of the reagent preparation; and a transmission unit which transmits the detected state information to a computer arranged outside the reagent preparation unit. The computer displays the received state information on a display.