The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 20, 2011

Filed:

Feb. 28, 2006
Applicants:

Michael J. Gormish, Redwood City, CA (US);

Yinqing Zhao, San Diego, CA (US);

Kathrin Berkner, Los Altos, CA (US);

Martin Boliek, San Francisco, CA (US);

Edward L. Schwartz, Sunnyvale, CA (US);

Inventors:

Michael J. Gormish, Redwood City, CA (US);

Yinqing Zhao, San Diego, CA (US);

Kathrin Berkner, Los Altos, CA (US);

Martin Boliek, San Francisco, CA (US);

Edward L. Schwartz, Sunnyvale, CA (US);

Assignee:

Ricoh Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus is disclosed herein for processing document images. In one embodiment, the method comprises extracting one or more features corresponding to one or more objects from a JPM compressed file, including extracting at least one of the one or more features without decoding, ranking document objects based on a task being performed by an application, and the one or more extracted features, and selecting a set of the document objects based on rank and at least one constraint.


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