The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2011
Filed:
Aug. 08, 2007
Daisuke Kotake, Yokohama, JP;
Kazuki Takemoto, Kawasaki, JP;
Kenji Morita, Yokohama, JP;
Sonoko Maeda, Kawasaki, JP;
Daisuke Kotake, Yokohama, JP;
Kazuki Takemoto, Kawasaki, JP;
Kenji Morita, Yokohama, JP;
Sonoko Maeda, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A marker arrangement information measuring apparatus includes an image acquiring unit configured to acquire a captured image, a marker detecting unit configured to detect markers from the captured image, a marker identifying unit configured to identify the marker detected by the marker detecting unit, an arrangement information calculating unit configured to calculate arrangement information of the marker based on an identification result of the marker identifying unit, an analyzing unit configured to analyze the identification result of the marker identifying unit, and a display unit configured to display an image corresponding to an analysis result of the analyzing unit on the captured image in a combined manner, thus presenting the analysis result to a user.