The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2011
Filed:
Oct. 31, 2008
Yijun Huang, Pleasantville, NY (US);
Tetsuyoshi Royama, Montvale, NJ (US);
Alexandre Kotchkin, Ridgewood, NJ (US);
Yijun Huang, Pleasantville, NY (US);
Tetsuyoshi Royama, Montvale, NJ (US);
Alexandre Kotchkin, Ridgewood, NJ (US);
Topcon Medical Systems, Inc., Oakland, NJ (US);
Abstract
Disclosed are method and apparatus for mapping retinal thickness values to a movable measurement grid. A three-dimensional volume dataset acquired from three-dimensional optical coherence tomography is registered to a fundus image by rendering a two-dimensional composite image from the three-dimensional volume dataset and superimposing characteristic features in the two-dimensional composite image upon corresponding characteristic features in the fundus image. A measurement grid is displayed on the two-dimensional composite image. The measurement grid is moved to a region of interest, and retinal thickness values in the region of interest are mapped to sectors within the measurement grid.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile